Spatially-Resolved Conductivity Mapping of Ultra-Thin Glass Using GuardRing Electrodes and Silver Conductive Ink Contact Layers

This paper presents a spatially-resolved conductivity mapping method for ultra-thin, brittle, and surface-rough dielectric samples. The method combines a three-terminal guard ring electrode configuration with silver conductive ink contact layers applied by tampon printing, and spring-loaded pogo-pin probes integrated into an automated XY gantry system. The key novelty is not spatially-resolved conductivity measurement per se, but a specific contact architecture that simultaneously addresses surface roughness, mechanical fragility, and high-field operation, a combination not covered by any existing single method. Validation measurements on SCHOTT AS87 eco aluminosilicate glass (100 µm, σ = 5.6 × 10⁻¹² S/cm) using three guard ring configurations at defined spatial positions on two reference samples yield conductivity values of 5.5 to 5.8 pS/cm at 30 kV/cm for the 1.0 mm guard gap configuration, in excellent agreement with the manufacturer specification. The spatial variation across measurement positions confirms sample homogeneity and demonstrates the method’s capability for position-resolved dielectric characterisation.